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Reliability / Measuring instrument / Thermomechanical analysis / Failure analysis / Electron microscope / Dynamic mechanical analysis / Atomic force microscopy / Characterization / MIL-STD-883 / Science / Materials science / Scientific method


Fraunhofer Institute for Reliability and M i c r o i n t e g r at i o n I Z M Focused Ion Beam • Design parameter effect analysis (geometry, material, load profile)
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Document Date: 2015-03-18 10:12:33

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File Size: 2,60 MB

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Company

EMC / /

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Facility

Fraunhofer Institute / Contact Fraunhofer Institute / /

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IndustryTerm

gas testing / e-module / technology testing / microscopic applications / 3D Internet www.izm.fraunhofer.de / /

Organization

Contact Fraunhofer Institute for Reliability / Fraunhofer Institute for Reliability / /

Person

Ion Beam / Harald Pötter / /

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ProgrammingLanguage

DC / /

Technology

laser / tomography / X-ray / simulation / /

URL

www.izm.fraunhofer.de / /

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