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Chapter 18 Accelerated Test Models William Q. Meeker and Luis A. Escobar Iowa State University and Louisiana State University
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Document Date: 2014-01-13 04:42:35

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83 Degrees / John Wiley & Sons Inc. / Mead / Breakdown Times / Intel / /

Facility

Louisiana State University / State University / /

IndustryTerm

metal / reliability products / electronic equipment / chemical degradation / higher technology products / reaction activation energy / failure-causing chemical/physical process / reaction-specific activation energy / activation energy / chemical process reaction rates / physical/chemical / /

Organization

Iowa State University / Louisiana State University / /

Person

Luis A. Escobar / William Q. Meeker / /

Position

Model for degradation over time / /

ProvinceOrState

Louisiana / /

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