IBM / Prentice-Hall / MIT Press / SEU Fault Rates Semiconductor / John Wiley and Sons / Background Semiconductors / Aeronautics and Astronautics Inc. / /
Event
Product Issues / Extinction / /
Facility
NASA Langley Research Center / American Institute of Aeronautics / /
IndustryTerm
high-energy particle / memory chip / watchdog processors / aerospace applications / nonlinear energy deposition rates / given chip / aerospace computer / software execution / reliability systems / process technology / redundant processors / metal interconnections / faulty chips / satellite memory / control system software / minimum geometry devices / Memory chips / /
Organization
MIT / Mw / American Institute of Aeronautics and Astronautics / National Aeronautics and Space Administration / NASA Langley Research Center / /
Product
word / digit / digits / probability / memory digits / chips / /
ProvinceOrState
New Jersey / Connecticut / California / /
TVStation
Kbit / /
Technology
semiconductor / alpha / radiation / RAM / EVENT UPSETS A. M. Finn United Technologies / random access / SRAM / operating system / process technology / Memory chips / watchdog processors / 4 static RAM chips / semiconductors / memory chip / permanently faulty chips / simulation / given chip / 1K bit static RAM chips / integrated circuit / /
SYSTEM EFFECTS OF SINGLE EVENT UPSETS A. M. Finn United Technologies Research Center Silver Lane East Hartford, CT 06108