MicroScope

Results: 2998



#Item
11

KNMF Laboratory for Microscopy and Spectroscopy Helium Ion Microscope (HIM) The Zeiss Orion NanoFab allows high-resolution imaging with high surface sensitivity and a depth-of-field 5-10 times higher than in a modern FE

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Source URL: www.knmf.kit.edu

Language: English - Date: 2018-03-27 09:44:43
    12

    Product Information Version 1.0 ZEISS Smartproof 5 Your Integrated Widefield Confocal Microscope for Surface Analysis in Quality Assurance and Quality Control

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    Source URL: www.aurox.co.uk

    Language: English - Date: 2017-01-18 05:04:07
      13

      THE MICROSCOPE • Vol. 64:3, pp 119–129, 2016 C R I T I C A L FOCUS Brian J. Ford Fantastic Physics — and Worlds We Never See

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      Source URL: www.brianjford.com

      Language: English - Date: 2017-01-30 09:35:13
        14

        原子間力顕微鏡用製品のご紹介 AFM用二分割センサーアンプ AFM(Atomic Force Microscope): 原子間力顕微鏡

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        Source URL: www.graviton.co.jp

        Language: Japanese - Date: 2018-01-02 21:42:04
          15

          THE MICROSCOPE • Vol. 64:1, pp 27–39, 2016 C R I T I C A L FOCUS Brian J. Ford Cloudy with a Chance of Microbes

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          Source URL: www.brianjford.com

          Language: English - Date: 2016-11-25 11:09:04
            16

            Biology 171L – General Biology Lab I Lab 5: Using the Microscope and Observing Cells and Cell Structures Introduction Of all the tools that scientists use, perhaps the microscope is the distinctive tool of the biologis

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            Source URL: windward.hawaii.edu

            Language: English - Date: 2016-06-22 17:48:21
              17

              Microsoft Word - Microscope User Guide.doc

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              Source URL: homepage.ntu.edu.tw

              Language: Korean - Date: 2015-12-14 23:13:03
                18

                Illuminated Stage Version III Richard J. Nelson Introduction This article is a follow up to a previous article that discussed the construction of two illuminated stages specifically intended for use with a USB Microscope

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                Source URL: www.msscweb.org

                Language: English - Date: 2012-01-02 20:41:08
                  19

                  Application Note In-situ Scanning Electron Microscope (SEM) supplements Scanning Probe Microscopy (SPM)

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                  Source URL: www.orsayphysics.com

                  Language: English - Date: 2016-06-28 08:33:21
                    20

                    Argonne National Laboratory Scanning Confocal Electron Microscope (SCEM): Nanoscale Quality Control in Semiconductor Manufacturing and R&D In today’s technologically driven society, many important electronic/photonic d

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                    Source URL: www.amc.anl.gov

                    Language: English - Date: 2005-07-25 16:04:26
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