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Carrier scattering / Electron beam / Electron beam induced current / Semiconductor device fabrication


F R A U N H O F E R I N S T I T U T E F O R I N T E G R AT E D S Y S T E M S A N D D E V I C E T E C H N O L O G Y 1 1
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Document Date: 2015-06-08 11:56:43


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Company

D S Y S T E M S A / Integrated Systems / /

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Event

Product Issues / /

Facility

Fraunhofer Institute / /

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IndustryTerm

power electronic devices / /

Organization

Fraunhofer Institute / /

Person

Adam Tokarski / /

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Product

gate structure / /

Technology

semiconductor / adam / mechanism Device Technology / THERMOGRAPHY / /

URL

www.iisb.fraunhofer.de / /

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