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Econometrics / Functional analysis / Volterra series / Linear regression / Scattering parameters / Cluster-weighted modeling / Transistor model / Economic model / Electronic filter / Statistics / Electronic engineering / Regression analysis
Date: 2011-12-13 18:32:02
Econometrics
Functional analysis
Volterra series
Linear regression
Scattering parameters
Cluster-weighted modeling
Transistor model
Economic model
Electronic filter
Statistics
Electronic engineering
Regression analysis

DATA-DRIVEN MODELING OF NON-LINEAR MICROWAVE DEVICES Bernd Schoner and Neil A. Gershenfeld Physics and Media Group MIT Media Laboratory Cambridge, MA 02139

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