Ann Arbor / York / Norwood / Eugene / Washington / DC / Zurich / Philadelphia / Leuven / Santa Rosa / San Diego / /
Company
Automatic RF Techniques Group / Advanced Characterization Group / Volterra / Agilent Technologies Inc. / Hewlett-Packard Company / Electrical Engineering Laboratory / IEEE TRANSACTIONS / /
Country
Belgium / United States / United Kingdom / /
Currency
USD / /
Facility
University of York / National Institute of Standards and Technology / University of California at Berkeley / The University of Leeds / Oregon State University / /
IndustryTerm
needle-probe bias network / parasitic networks / microwave device / nonlinear microwave devices / suppressed carrier / baseband distortion products / distortion products / lowest order mixing products / wideband communication systems / bias networks / wireless systems / metal shim / sine-wave carrier / wireless communications / energy / post-processing routine / millimeter-wave applications / circuit technology / telecommunications applications / bias network / nonlinear systems / electronics / higher order mixing products / /
MusicGroup
TWA / /
Organization
Eidgenössische Technische Hochschule / University of California / University of Leeds / Leeds / University of York / U.S. Government / Oregon State University / Executive Committee / Department of Commerce Bronze and Silver Medals / Fund for Scientific Research / K.U. Leuven / National Institute of Standards and Technology / Department of Commerce Silver Medal / Telecommunications and Microwave Division / Electromagnetic Fields Division / Katholieke Universiteit Leuven / Radio-Frequency Technology Division / /
Person
J. Verspecht / D. J. Williams / T. Van den Broeck / Kate A. Remley / Dylan F. Williams / H. Ku / John Wood / P. J. Tasker / J. Leckey / /
2576 IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, VOL. 52, NO. 11, NOVEMBER 2004 Simplifying and Interpreting Two-Tone Measurements Kate A. Remley, Member, IEEE, Dylan F. Williams, Fellow, IEEE,