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IEEE MICROWAVE AND GUIDED WAVE LETTERS, VOL. 9, NO. 5, MAY[removed]Characteristic Impedance, Power, and Causality Dylan F. Williams, Senior Member, IEEE, and Bradley K. Alpert, Member, IEEE
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Document Date: 1999-07-01 13:52:58


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City

New York / /

Company

McGraw-Hill / /

Country

United States / /

/

Facility

National Institute of Standards and Technology / /

IndustryTerm

metal / passive devices / modal field solutions / m-thick metal signal / /

Organization

National Institute of Standards and Technology / U.S. Government / /

Person

Dylan F. Williams / Bradley K. Alpert / /

Position

conductor / ground conductor / /

ProvinceOrState

Colorado / /

Technology

semiconductor / MICROWAVE / /

URL

http /

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