![Radio electronics / Analog circuits / Electronic test equipment / Laboratory equipment / Electrical engineering / Small-signal model / Scattering parameters / Amplifier / Large-signal model / Electronic engineering / Electronics / Electromagnetism Radio electronics / Analog circuits / Electronic test equipment / Laboratory equipment / Electrical engineering / Small-signal model / Scattering parameters / Amplifier / Large-signal model / Electronic engineering / Electronics / Electromagnetism](https://www.pdfsearch.io/img/fec484be33a59d1dd22c58376b38aa7e.jpg) Date: 2005-10-18 15:46:06Radio electronics Analog circuits Electronic test equipment Laboratory equipment Electrical engineering Small-signal model Scattering parameters Amplifier Large-signal model Electronic engineering Electronics Electromagnetism | | IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, VOL. 53, NO. 4, APRIL[removed]Linearization of Large-Signal Scattering Functions Jan Verspecht, Senior Member, IEEE, Dylan F. Williams, Fellow, IEEE, Dominique SchAdd to Reading ListSource URL: www.eeel.nist.govDownload Document from Source Website File Size: 435,35 KBShare Document on Facebook
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