<--- Back to Details
First PageDocument Content
Metaphysics / Artificial intelligence / Cognition / Machine learning / Learning / Alan Turing / Artificial neural network / Market research / Concept learning / Outline of machine learning / Turing test / Deep learning
Date: 2015-12-10 14:07:34
Metaphysics
Artificial intelligence
Cognition
Machine learning
Learning
Alan Turing
Artificial neural network
Market research
Concept learning
Outline of machine learning
Turing test
Deep learning

RESEARCH ARTICLES ◥ COGNITIVE SCIENCE

Add to Reading List

Source URL: cims.nyu.edu

Download Document from Source Website

File Size: 1,74 MB

Share Document on Facebook

Similar Documents

Artificial intelligence / Statistics / Machine learning / Nonparametric statistics / Statistical classification / Feature detection / Learning / Histogram / Naive Bayes classifier / Outline of object recognition / K-means clustering / Bag-of-words model

¨ ETH Zurich Computer Science Department Prof. Marc Pollefeys Prof. Luc Van Gool

DocID: 1roMm - View Document

Education / Machine learning / Learning / Feature detection / Artificial intelligence / Feature learning / Deep learning / Feature / Outline of object recognition / Educational technology / Computer vision / Bag-of-words model in computer vision

Microsoft Word - Fergus.doc

DocID: 1qV9Y - View Document

Artificial intelligence / Statistics / Machine learning / Nonparametric statistics / Statistical classification / Feature detection / Learning / Histogram / Naive Bayes classifier / Outline of object recognition / K-means clustering / Bag-of-words model

¨ ETH Zurich Computer Science Department Prof. Marc Pollefeys Prof. Luc Van Gool

DocID: 1qR34 - View Document

Feature detection / Artificial intelligence / Image processing / Machine learning / Outline of object recognition / Image segmentation / Hough transform / Pattern recognition / Constellation model / Learning / One-shot learning / Bag-of-words model in computer vision

Electronic Letters on Computer Vision and Image Analysis 0(0):1-7, 2000 Optimal Geometric Matching for Patch-Based Object Detection Daniel Keysers∗ and Thomas Deselaers+ and Thomas M. Breuel∗† ∗

DocID: 1qvZw - View Document

Machine learning / Learning / Artificial intelligence / Statistical classification / Image processing / Data mining / Multiple kernel learning / Image segmentation / Kernel / K-nearest neighbors algorithm / Conditional random field / Outline of object recognition

Multi-Class Object Localization by Combining Local Contextual Interactions Carolina Galleguillos† Brian McFee† Serge Belongie† Gert Lanckriet‡ † Computer Science and Engineering Department

DocID: 1qkeb - View Document