SISPAD 2012, September 5-7, 2012, Denver, CO, USA Predictive TCAD Approach for the Analysis of Hot-Carrier-Stress Degradation in Integrated STI-based LDMOS Transistors Susanna Reggiani, Gaetano Barone, - Monolithic microwave integrated circuit - Document - PDFSEARCH.IO

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	SISPAD 2012, September 5-7, 2012, Denver, CO, USA Predictive TCAD Approach for the Analysis of Hot-Carrier-Stress Degradation in Integrated STI-based LDMOS Transistors Susanna Reggiani, Gaetano Barone, Add to Reading List Document Date: 2013-02-12 08:39:11 Open Document File Size: 631,05 KB Share Result on Facebook

SISPAD 2012, September 5-7, 2012, Denver, CO, USA Predictive TCAD Approach for the Analysis of Hot-Carrier-Stress Degradation in Integrated STI-based LDMOS Transistors Susanna Reggiani, Gaetano Barone,Add to Reading List