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Extreme ultraviolet lithography / Multiple patterning / Immersion lithography / Photolithography / Extreme ultraviolet / Photoresist / 11 nanometer / X-ray lithography / ASML Holding / Microtechnology / Materials science / Technology


Extreme Ultraviolet Lithography: Towards the Next Generation of Integrated Circuits THE VIEWPOINT - Optical lattice solitons: Guiding and routing light at will
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Document Date: 2010-03-11 13:42:27


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File Size: 1,52 MB

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City

Austin / Newport / Jena / Sunnyvale / /

Company

IBM / Hynix / EUV LLC / NTT LSI Laboratories / Nikon / Globalfoundry / TSMC / Motorola / Mask Products Business Group / Samsung Electronics Corporation / AT&T Bell Laboratories / McGraw-Hill / Hitachi / Oxford Instruments / Lawrence Livermore National Laboratory / Lawrence Berkeley National Laboratory / Toshiba / Applied Materials Inc. / Applied MAterial Inc. / Cleans / Virtual National Laboratories / Mask Etch / Sandia National Laboratory / Intel / Photronics Inc. / Advanced Micro Devices / /

Continent

Asia / North America / Europe / /

Country

Germany / Japan / United States / /

Currency

GBP / USD / /

Facility

Lawrence Livermore National Laboratory / National Institute of Standards and Technology / University of Central Florida / Santa Clara University / Indian Institute of Technology / Fraunhofer Institute / /

IndustryTerm

target technology node / exposure tools / field exposure tools / alpha lithography step-and-scan tools / node lithography technology / mask fabrication feasible with current technology / technology development / nm technology node / High volume manufacturing / optical systems / double patterning technology / immersion exposure technology / lithography technology / volume manufacturing / related products / pilot-scale applications / photoresist technology / electronics industry / electronic devices / nm node technology / technology node / limit using immersion exposure technology / exposure tool / exposure systems / mask technology / /

Organization

Fraunhofer Institute for Applied Optics and Precision Engineering / Extreme Ultraviolet Lithography System Development Association / NGL league / National Institute of Standards and Technology / Santa Clara University / University of Central Florida / Association of Super-Advanced Electronics Technologies / Indian Institute of Technology / /

Person

Benjamin G. Eynon / Jr. / Andras Vladar / Richard M. Silver / Ajay Kumar / Henry Kamberian / Bruno La Fontaine / Patrick Naulleau / Banqiu Wu / Martin Richardson / /

Position

CTO / Collector / General Manager / /

ProgrammingLanguage

NGL / /

Region

Central Florida / /

SportsEvent

EPL / /

Technology

semiconductor / Alpha / 32 nm node technology / X-ray / promising NGL technology / EUVL mask technology / photoresist technology / Lithography / double patterning technology / Integrated Circuits / EUVL technology / limit using immersion exposure technology / laser / Lithography System / semiconductors / lasers / immersion exposure technology / lithography technology / two-generation node lithography technology / integrated circuit / NGL technologies / /

URL

www.opfocus.org / /

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