![Ultraviolet / Extreme ultraviolet / Mask / 45 nanometer / Microtechnology / Multiple patterning / Next-generation lithography / Electromagnetic radiation / Extreme ultraviolet lithography / Photomask Ultraviolet / Extreme ultraviolet / Mask / 45 nanometer / Microtechnology / Multiple patterning / Next-generation lithography / Electromagnetic radiation / Extreme ultraviolet lithography / Photomask](https://www.pdfsearch.io/img/049b852348cc7d41828c8006c8d2c7a6.jpg)
| Document Date: 2009-03-25 10:39:55 Open Document File Size: 171,88 KBShare Result on Facebook
Company Philips / ASML / / Continent Europe / / Country Japan / United States / / / / IndustryTerm substrate devices / nm devices / graphy tool maker / immersion technology / metrology equipment / ion beam deposition tool / process equipment / metrology tools / / Organization Information Society / The Netherlands EUREKA MEDEA+ Office / European Union / / Person Jan Hendrik Peters / / / Position leader / co-operative / / / PublishedMedium the Information Society / / Technology semiconductor / Lithography / immersion technology / EUV technologies / / URL http /
SocialTag |