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Ultraviolet / Extreme ultraviolet / Mask / 45 nanometer / Microtechnology / Multiple patterning / Next-generation lithography / Electromagnetic radiation / Extreme ultraviolet lithography / Photomask


PROJECT RESULT Lithography T404: Extreme UV lithography masks (EXTUMASK)
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Document Date: 2009-03-25 10:39:55


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File Size: 171,88 KB

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Company

Philips / ASML / /

Continent

Europe / /

Country

Japan / United States / /

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IndustryTerm

substrate devices / nm devices / graphy tool maker / immersion technology / metrology equipment / ion beam deposition tool / process equipment / metrology tools / /

Organization

Information Society / The Netherlands EUREKA MEDEA+ Office / European Union / /

Person

Jan Hendrik Peters / /

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Position

leader / co-operative / / /

PublishedMedium

the Information Society / /

Technology

semiconductor / Lithography / immersion technology / EUV technologies / /

URL

http /

SocialTag