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Electronics / MOSFET / CMOS / Field-effect transistor / Multiple patterning / Dynamic voltage scaling / International Electron Devices Meeting / Electronic engineering / Logic families / Technology
Date: 2013-01-06 22:14:17
Electronics
MOSFET
CMOS
Field-effect transistor
Multiple patterning
Dynamic voltage scaling
International Electron Devices Meeting
Electronic engineering
Logic families
Technology

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