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SISPAD 2012, September 5-7, 2012, Denver, CO, USA Development of Predictive Model and Circuit Simulation Methodology for Negative Bias Temperature Instability Effects C. Ma, H. J. Mattausch, M. Miyake,
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Document Date: 2013-02-12 08:39:15
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SISPAD 2012, September 5-7, 2012, Denver, CO, USA Development of Predictive Model and Circuit Simulation Methodology for Negative Bias Temperature Instability Effects C. Ma, H. J. Mattausch, M. Miyake,