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Date: 2010-12-31 00:08:38 | Oxygen defect structure of oxygen ionic and electronic mixed conductive oxides at high temperatures Kagomiya I, Kinoshita T., Kakimoto K. and Ohsato H. Nagoya Institute of Technology This study tries to investigate the fAdd to Reading ListSource URL: quasi.issp.u-tokyo.ac.jpDownload Document from Source WebsiteFile Size: 39,14 KBShare Document on Facebook |