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Electronic engineering / Electrical engineering / Electromagnetism / Integrated circuits / Semiconductor devices / Electronic design / Logic families / Electronic circuits / MOSFET / Drain-induced barrier lowering / CMOS / Threshold voltage


2015 20th IEEE European Test Symposium (ETS) ! New Drain Current Model for Nano-Meter MOS Transistors On-Chip Threshold Voltage Test
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Document Date: 2015-08-06 17:54:54

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File Size: 288,61 KB

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