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Electrical engineering / Semiconductors / Short-channel effect / Transistor / Field-effect transistor / Electron mobility / Drain Induced Barrier Lowering / Channel length modulation / Power MOSFET / Electronic engineering / Technology / MOSFET
Date: 2011-11-18 13:54:24
Electrical engineering
Semiconductors
Short-channel effect
Transistor
Field-effect transistor
Electron mobility
Drain Induced Barrier Lowering
Channel length modulation
Power MOSFET
Electronic engineering
Technology
MOSFET

Compact model for ultra-short channel four-terminal DG MOSFETs for exploring circuit characteristics T. Nakagawa*, T. Sekigawa*, T. Tsutsumi**, M. Hioki*, E. Suzuki*, and H. Koike* * Electroinformatics Group,

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