First Page | Meta Content | |
---|---|---|
![]() | Document Date: 2012-11-22 21:57:14Open Document File Size: 1,73 MBShare Result on FacebookCompanyTerms & Conditions Park Systems / Probes Fit All Commercial AFM Systems Agilent Technologies / Veeco Instruments / Hitachi / Applied NanoStructures Inc. / / /FacilityUniversity of Connecticut / FORT Force / /IndustryTermmetal coatings / probe chips / alignment chips / characterization services / Well-established silicon technology / close contact mode applications / probe chip / imaging / /OrganizationUniversity of Connecticut / FORT Force / Plateau Probes Force / Ball Probes/Colloidal Probes Force / Huey AFM Lab / /PersonVarun Vyas / Al Probe / Brian D. Huey / / /PositionMajor / General / /ProvinceOrStateConnecticut / /Technologylaser / silicon technology / alignment chips / probe chips / SRAM / AFM probe chip / probe chip / /URLwww.appnano.com / /SocialTag |