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Chemistry / Atomic force microscopy / Microscopy / Scanning tunneling microscope / Microscope / Magnetic force microscope / Nanosensors / Scanning probe microscopy / Science / Scientific method


INSTITUTE OF PHYSICS PUBLISHING NANOTECHNOLOGY Nanotechnology[removed]–1579
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Document Date: 2011-02-10 14:18:35


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File Size: 568,37 KB

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City

Cambridge / Thorlabs / /

Company

SPI Supplies / Perot / IOP Publishing Ltd / Veeco Instruments / JDS Uniphase / Sigma-Aldrich / /

Country

United States / United Kingdom / /

Currency

USD / /

/

Facility

Massachusetts Institute of Technology / Purdue University / INSTITUTE OF PHYSICS PUBLISHING NANOTECHNOLOGY Nanotechnology / /

IndustryTerm

high thermal energy / repeated imaging / optical readout hardware / nanostructure imaging response / ambient imaging environments / probe imaging techniques / hostile imaging environment / scottm@media.mit.edu / nanostructure imaging / concentric cylindrical steel shield / laboratory imaging environment / imaging / probe imaging / optical lever hardware / tapping mode AFM imaging / /

Organization

Biological Engineering Division / Air Force office of Sponsored Research / INSTITUTE OF PHYSICS PUBLISHING NANOTECHNOLOGY Nanotechnology / Massachusetts Institute of Technology / Purdue University / Department of Mechanical Engineering / /

Person

Thomas Burg / Nano / Craig Prater / /

Position

Author / microscope controller / representative / feedback controller / controller / /

ProvinceOrState

Massachusetts / /

Technology

laser / spectroscopy / /

SocialTag