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Science / Thin film deposition / Thin-film optics / Optics / X-ray optics / Semiconductor device fabrication / Anti-reflective coating / Nuclear Spectroscopic Telescope Array / Coating / Radiography / Electromagnetic radiation / Technology


Coatings for the NuSTAR mission Finn E. Christensena, Anders C.Jakobsena, Nicolai F. Brejnholta, Kristin K Madsenb, Allan Hornstrupa, Niels J.Westergaarda, Joan Momberga, Jason Koglinc, Anne M. Fabricantc, Marcela Sternc
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Document Date: 2012-01-15 21:46:19


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City

Grunenplan / Copenhagen / Pt / Pasadena / New York / /

Company

Wacker Siltronic AG / Space Radiation Laboratory / National Laboratory / Angstrom Sciences Inc. / Optics LLC / /

Country

Germany / Columbia / Denmark / /

Currency

USD / /

Facility

keV DTU facility / RaMCaF facility / DTU facility / California Institute of Technology / Columbia University / /

IndustryTerm

energy band / high energy astrophysics / high energy scattering / power law progression / high energy data / high energy / design power law / high energy scatter / mirror / energy / /

Organization

California Institute of Technology / HEFT mission / National Aeronautics and Space Administration / Danish Technical University / National Space Institute / NuSTAR mission / Columbia University / New York / /

Person

Giovanni Pareschi / Michael J. Pivovaroffd / Joan Momberga / David Windte / Stephen L. O'Dell / Lawrence Livermore / Marcela Sternc / William W. Craigd / Anders C.Jakobsena / Anne M. Fabricantc / Allan Hornstrupa / Kristin K Madsenb / Jason Koglinc / /

Position

representative / /

Product

NuSTAR / /

ProvinceOrState

New York / California / /

Technology

X-ray / /

SocialTag