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Date: 2008-08-29 19:33:45Regression analysis Computer memory MOSFET Normal distribution Dynamic random-access memory Standard deviation Threshold voltage Systematic error Errors and residuals in statistics Statistics Data analysis Measurement | VARIUS: A Model of Parameter Variation and Resulting Timing Errors for Microarchitects ∗ Radu Teodorescu, Brian Greskamp, Jun Nakano, Smruti R. Sarangi, Abhishek Tiwari and Josep Torrellas University of Illinois at UrbAdd to Reading ListSource URL: iacoma.cs.uiuc.eduDownload Document from Source WebsiteFile Size: 341,26 KBShare Document on Facebook |
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