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Regression analysis / Computer memory / MOSFET / Normal distribution / Dynamic random-access memory / Standard deviation / Threshold voltage / Systematic error / Errors and residuals in statistics / Statistics / Data analysis / Measurement
Date: 2008-08-29 19:33:45
Regression analysis
Computer memory
MOSFET
Normal distribution
Dynamic random-access memory
Standard deviation
Threshold voltage
Systematic error
Errors and residuals in statistics
Statistics
Data analysis
Measurement

VARIUS: A Model of Parameter Variation and Resulting Timing Errors for Microarchitects ∗ Radu Teodorescu, Brian Greskamp, Jun Nakano, Smruti R. Sarangi, Abhishek Tiwari and Josep Torrellas University of Illinois at Urb

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