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| First Page | Document Content | |
|---|---|---|
 Date: 2004-10-15 10:24:20Materials science Spectroscopy Nuclear physics Particle accelerators Surface chemistry Particle-induced X-ray emission Ion beam analysis Rutherford backscattering spectrometry Nuclear microscopy Physics Science Scientific method |
| Solid phase epitaxy of ultra-shallow Sn implanted Si observed using highresolution Rutherford backscattering spectrometry T. K. Chan, F. Fang, A. Markwitz, and T. Osipowicz Citation: Appl. Phys. Lett. 101, );DocID: 1uZnZ - View Document |
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| EPJ Web of Conferences 35, DOI: epjconf C Owned by the authors, published by EDP Sciences, 2012 Application of Nuclear Microprobes towards Understanding Complex OreDocID: 17Ezr - View Document |
| PDF DocumentDocID: 17bNb - View Document |
| Plenary Talks – IISC-20 Name Title P. DastoorDocID: 15ATG - View Document |