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Electronic engineering / Joint Test Action Group / Boundary scan / Serial Vector Format / Field-programmable gate array / Automatic test pattern generation / Berkeley Software Distribution / Boundary scan description language / Electronics manufacturing / Manufacturing / Electronics


onTAP® Series 4000 with ProScan B o u n d a r y S c a n
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Document Date: 2011-06-14 10:41:40

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File Size: 716,50 KB

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Company

Flynn Systems Corp. / TDI / 4 onTAP Series 4000 Application Note Flynn Systems Corporation / onTAP Series 4000 Application Note Flynn Systems Corporation / /

IndustryTerm

component/device / non-scan devices / nonscan devices / components/devices / /

Person

PIO TCK TMS TRST / /

Position

Test executive / /

Product

onTAP Series 4000 Application Note Procedure / /

ProgrammingLanguage

R / /

Technology

FPGA / SRAM / flash / JTAG / CAD / /

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