Aberration-corrected scanning transmission electron microscopy: Probing individual atoms Ondrej L. Krivanek Nion Co., Kirkland, WA, USA (www.nion.com)

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Date: 2011-05-19 17:42:40 Physics Microscopes Electron beam Electron energy loss spectroscopy Spectroscopy Electron microscope Scanning transmission electron microscopy Electron Transmission electron microscopy Scientific method Electron microscopy Science		Aberration-corrected scanning transmission electron microscopy: Probing individual atoms Ondrej L. Krivanek Nion Co., Kirkland, WA, USA (www.nion.com) Add to Reading List Source URL: depts.washington.edu Download Document from Source Website File Size: 170,19 KB Share Document on Facebook

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