University of Delaware / OpSIS foundry / California Institute of Technology / University of Pennsylvania / /
IndustryTerm
post-processing stage / depth imaging / on-chip optical processing / reflective and transmissive imaging / silicon-on-insulator technology node / index contrast imaging mode / transmissive imaging mode / optical signal processing / signal processing make / Reflective imaging mode / transmissive imaging setup / post processing / bio-medical imaging / nanophotonic chip / imaging / coherent 3D imaging / aluminum metal layers / compact 3D imaging laser radar system / photonic chip / index contrast imaging / nanophotonic systems / bench-top systems / silicon electronics / infrared imaging camera / silicon nanophotonic chip / projection systems / splitter network / 3D imaging / 3D imaging systems / refractive index contrast imaging / high-resolution 3D imaging / refraction contrast imaging / 3D reflective imaging / index contrast imaging modes / /
Organization
California Institute of Technology / Optical Society of America OCIS / University of Delaware / University of Pennsylvania / Philadelphia / Department of Electrical Engineering / Department of Electrical and Systems Engineering / /
Person
M. R. Watts / E. Timurdogan / Micheal Hochberg / Behrooz Abiri / J. Sun / A. Yaacobi / E. Shah Hosseini / Tom Baehr-Jones / /