Proc. Asia South Pacific Design Automation Conf. (ASP-DAC), Shanghai, China, vol. 1, Jan. 2005, pp. I 2-I 7. Opportunities and Challenges for Better Than Worst-Case Design Todd Austin, Valeria Bertacco, David Blaauw, an - Oram - Document - PDFSEARCH.IO

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Date: 2016-04-03 10:58:13 Electronic engineering Computing Engineering Electronic design automation Microprocessors Central processing unit Digital electronics Electronic design Adder Propagation delay Standard cell Static timing analysis		Proc. Asia South Pacific Design Automation Conf. (ASP-DAC), Shanghai, China, vol. 1, Jan. 2005, pp. I/2-I/7. Opportunities and Challenges for Better Than Worst-Case Design Todd Austin, Valeria Bertacco, David Blaauw, an Add to Reading List Source URL: web.eecs.umich.edu Download Document from Source Website File Size: 462,52 KB Share Document on Facebook

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