Inside Front Cover: Defect Tolerance and Nanomechanics in Transistors that Use Semiconductor Nanomaterials and Ultrathin Dielectrics (Adv. Funct. Mater)

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Date: 2008-09-08 15:02:12 Chemistry Semiconductor device fabrication Inorganic compounds Electronic engineering Thin film deposition High- dielectric Transistors Crystalline silicon Wafer Silicon on insulator Atomic layer deposition Gallium arsenide		Inside Front Cover: Defect Tolerance and Nanomechanics in Transistors that Use Semiconductor Nanomaterials and Ultrathin Dielectrics (Adv. Funct. Mater) Add to Reading List Source URL: rogers.matse.illinois.edu Download Document from Source Website File Size: 704,94 KB Share Document on Facebook

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