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Integrated circuits / Automatic test pattern generation / Linear-feedback shift register / Built-in self-test / Scan chain / Hardware Trojan
Date: 2015-01-10 06:34:49
Integrated circuits
Automatic test pattern generation
Linear-feedback shift register
Built-in self-test
Scan chain
Hardware Trojan

Low Power MSIC Signatures for Effective BIST Design Chekka Narasimha Rao M.Tech Student, Audi Sankara Institute of Technology, NH-5 Bypass Road, East Gudur Rural, Andrapradesh

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