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Field-programmable gate array / Electronic design automation / Nios II / ALGOL 68 / Placement / Joint Test Action Group / Region-based memory management / Partial re-configuration / Electronic engineering / Electronics / Altera
Field-programmable gate array
Electronic design automation
Nios II
ALGOL 68
Placement
Joint Test Action Group
Region-based memory management
Partial re-configuration
Electronic engineering
Electronics
Altera

Design Planning for Partial Reconfiguration

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