Google / Pearson / Dole / Medline / SPSS / European Classification Systems / /
Country
Netherlands / Sweden / United States / United Kingdom / Spain / / /
Facility
University of Amsterdam / Institute of Prospective Technology Studies / Chalmers University of Technology / University of Sussex / /
IndustryTerm
technology indicators / patent classification systems / long chain / industrial applications / clustering algorithm / search engines / classification systems / citation network / co-classification network / /
MarketIndex
IPC / /
Organization
International Patent Documentation Center / Japan Patent Office / Institute of Prospective Technology Studies / US Patent and Trademark Office / WIPO’s PCT / Japanese Patent Office / Chalmers University of Technology / OECD / Amsterdam School of Communication Research / Trade Office / Corporate Invention Board / University of Sussex / Organization for Economic Cooperation and Development / United States Patent and Trademark Office / University of Amsterdam / European Commission / European Patent Office / World Intellectual Property Organization / US Patent and Trade Office / Universitat Politècnica / Freeman Centre / /
Person
Ismael Rafols / Van Eck / Duncan Kushnir / Van Nees / /
Interactive Overlay Maps for US Patent (USPTO) Data Based on International Patent Classifications (IPC) Scientometrics (in press) Loet Leydesdorff, a* Duncan Kushnir,b and Ismael Rafols c,d Abstract We report on the deve