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Imaging / Digital imaging / Electromagnetic radiation / Optical devices / Vignetting / Active pixel sensor / Photodiode / Pixel / Defective pixel / Optics / Digital photography / Image sensors


QE Reduction due to Pixel Vignetting in CMOS Image Sensors Peter B. Catrysse, Xinqiao Liu, and Abbas El Gamal
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Document Date: 2004-09-20 19:09:42


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Abbas El Gamal Information Systems Laboratory / /

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pence / USD / /

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Tapered tunnel / /

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IndustryTerm

metal / appropriate imaging optics / technology scales / metal layer / metal layer acting / uniform image field using imaging optics / telecentric imaging lens / illuminated surface imaging experiment / technology generation / off-axis pixel responses using imaging optics / technology scaling / 16mm imaging lens / potential solutions / illuminated surface imaging model / metal layer enabling incident light / manufacturing / metal digital pixel sensor / imaging / metal layers / telecentric lens systems / designed imaging optics / /

MarketIndex

set 10 / /

Organization

Fiber Pinhole Board / Stanford University Stanford / /

Person

George M. Williams / Jr. / Thomas Yeh / Nitin Sampat / /

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Position

author / /

ProgrammingLanguage

V / /

ProvinceOrState

California / /

Technology

ADC / 5 0.3 025 02 Technology / dielectric / 0.35 0.3 0.25 0.2 0.15 Technology / Digital Photography / /

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