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Science / Nanomaterials / Metamaterials / Microscopy / Spectroscopy / Superlens / Photonic metamaterial / Ellipsometry / Surface plasmon resonance / Physics / Chemistry / Electromagnetism


Document Date: 2011-04-12 21:42:56

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City

Berlin / Erlangen / Melville / Leipzig / Lyngby / /

Company

Sandia National Laboratories / S. Xiao N.A. / Perot / Dielectric Films / Ge / Pendry / Advanced Optical Technologies / nm Ag / /

Country

Denmark / /

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EntertainmentAwardEvent

the 2009 SAOT Young Researcher Award / /

Facility

Technical University of Denmark / Purdue University / /

IndustryTerm

metal sublayer thickness / metal / energy dispersive x-ray spectroscopy / gas present / high surface energy / lower surface energy / random metal / metal filling factors / metal sublayer thicknesses / sub-diffraction imaging applications / material systems / multilayer metal / metal filling factor / multilayer systems / metal-based structure / metal films / thin metal films / possible applications / imaging / /

Organization

Technical University of Denmark / Graduate School / National Science Foundation / Danish Research Council for Technology and Production Sciences / A. Boltasseva School of Electrical and Computer Engineering / Computer Engineering and Birck Nanotechnology Center / Department of Micro / Purdue University / Friedrich-Alexander-Universität Erlangen-Nürnberg / Department of Photonics Engineering / /

Person

E.E. Narimanov / V / V.P. Drachev / V / Paul West / Z. Liu / W. Chen / Naresh Emani / A.K. Sarychev / V / T.A. Klar / V / R.J. Blaikie / C.P. Moore / A.V. Kildishev / V / Zubin Jacob / D.A. Genov / V / R.M. Bakker / V / Gururaj Naik / Raman Scattering / Alexander-Universität Erlangen-Nürnberg / Melville / E. Shamonina / V / /

Position

representative / V.P. / /

Product

Bruggeman / /

ProgrammingLanguage

DC / /

Technology

x-ray / spectroscopy / simulation / /

SocialTag