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Microsoft Word - S3-S8_TOC_Best-of-2014.doc
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Document Date: 2014-03-31 04:36:14


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hot filament chemical vapor deposition / charge carrier balance / energy gap / real time / carrier collection / quantum information technology / low triplet energy electron transporting layer / carrier mobility / energy / oxygen site / minority carrier diffusion path / metal surfaces / reduced chemical interaction / /

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Fauzia Jabeen / Cyril Popov / Walter R. L. Lambrecht / Helmut Fedder / Florian Schnabel / Dennis M. Callahan / Kenichi Takahata High / Kang Wei Chou / Tanveer Saleh / I. S. Babichuk / V / Lili Wang / Kornelius Nielsch / Jun Liu / Letter Sebastian Kokott / Stefan Hildebrandt / Andrew L. Goodwin / Ruipeng Li / Zhenan Bao / Letter Saptarshi Das / Jing Wang / Mehran Vahdani Moghaddam / Esther Alarcó-Lladó / Hsi-An Chen / S. S. Ponomaryov / V / Corsin Battaglia / Christo Petkov / Ying Diao / Joerg Appenzeller Screening / Michael G. Deceglie / Johann Peter Reithmaier / Wilhelm Kulisch / Colton R. Bukowsky / Tee Min Hian / Martin Heiss / Saijun Huang / Masoud Dahmardeh / Jonathan Grandidier / Eleonora Russo-Averchi / Gufeng He Improved / Daniel Rüffer / Kang Li / Mohamed Sultan Mohamed Ali / Raymond A. Weitekamp / Alireza Nojeh / Xiao Feng / Mohammad Ramezani / Emil Petkov / Electron Paramagnetic / Rahman III / Anna Fontcuberta / Sang-Yun Lee / Lars Matthes / Christophe Ballif / Gaurav Giri / Matthew J. Cliffe / Jan C. Hummelen / Friedhelm Bechstedt Silicene / Robert H. Grubbs / /

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Siemens S45 Cellular Phone / /

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semiconductor / Si-device technology / quantum information technology / X-ray / chemical vapor deposition / MEMS / dielectric / Crystallization / recombination / /

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