Surface and Interface 16A1 2002S2003 Analysis of X-ray reflectivity from sputtered carbon thin films (2) Wavelet transform analysis - Ponderosa Campground - Document - PDFSEARCH.IO

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Date: 2010-01-05 10:30:34 Wavelet Reflectivity Scientific method X-ray reflectivity Science Mexican hat wavelet Mathematical analysis Functional analysis Numerical analysis		Surface and Interface 16A1/2002S2003 Analysis of X-ray reflectivity from sputtered carbon thin films (2) Wavelet transform analysis Add to Reading List Source URL: pfwww.kek.jp Download Document from Source Website File Size: 72,34 KB Share Document on Facebook