![Crystallographic defects / Deep-level transient spectroscopy / Spectroscopy / Electron beam induced current / Solar cell / Dislocation / Semiconductor / Gallium nitride / IMEC / Chemistry / Materials science / Semiconductor device fabrication Crystallographic defects / Deep-level transient spectroscopy / Spectroscopy / Electron beam induced current / Solar cell / Dislocation / Semiconductor / Gallium nitride / IMEC / Chemistry / Materials science / Semiconductor device fabrication](https://www.pdfsearch.io/img/731dfdb75a5df011e849ddc862d1c85d.jpg) Date: 2014-02-28 08:40:44Crystallographic defects Deep-level transient spectroscopy Spectroscopy Electron beam induced current Solar cell Dislocation Semiconductor Gallium nitride IMEC Chemistry Materials science Semiconductor device fabrication | | Day 5 will take place at Department of Solid State Sciences. (www.solid.ugent.be/en/contact) Registration and financial support The number of participants is limited to 50 with a priority for PhD students. Pre-registrati
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