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Crystallographic defects / Deep-level transient spectroscopy / Spectroscopy / Electron beam induced current / Solar cell / Dislocation / Semiconductor / Gallium nitride / IMEC / Chemistry / Materials science / Semiconductor device fabrication
Date: 2014-02-28 08:40:44
Crystallographic defects
Deep-level transient spectroscopy
Spectroscopy
Electron beam induced current
Solar cell
Dislocation
Semiconductor
Gallium nitride
IMEC
Chemistry
Materials science
Semiconductor device fabrication

Day 5 will take place at Department of Solid State Sciences. (www.solid.ugent.be/en/contact) Registration and financial support The number of participants is limited to 50 with a priority for PhD students. Pre-registrati

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