Design Dependent Process Monitoring for Back-end Manufacturing Cost Reduction Tuck-Boon Chan∗ , Aashish Pant∗ , Lerong Cheng† , Puneet Gupta∗ {tuckie,apant,puneet , [removed], ∗ Depa - Process corners - Document - PDFSEARCH.IO

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Date: 2010-09-27 14:41:05 Semiconductor device fabrication Electromagnetism Wafer testing MOSFET Ring oscillator Very-large-scale integration Wafer Process corners Application-specific integrated circuit Electronic engineering Integrated circuits Electronics		Design Dependent Process Monitoring for Back-end Manufacturing Cost Reduction Tuck-Boon Chan∗ , Aashish Pant∗ , Lerong Cheng† , Puneet Gupta∗ {tuckie,apant,puneet}@ee.ucla.edu, [removed], ∗ Depa Add to Reading List Source URL: nanocad.ee.ucla.edu Download Document from Source Website File Size: 2,24 MB Share Document on Facebook

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