Nanosurf LensAFM Enhance Your Optical Microscope or Profilometer Atomic Force Microscope capabilities: • Visualize your samples with nanometer resolution • Obtain 3-dimensional surface structure data - Profilometer - Document - PDFSEARCH.IO

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	Nanosurf LensAFM Enhance Your Optical Microscope or Profilometer Atomic Force Microscope capabilities: • Visualize your samples with nanometer resolution • Obtain 3-dimensional surface structure data Add to Reading List Document Date: 2012-03-25 18:00:00 Open Document File Size: 1,18 MB Share Result on Facebook City Saugus / / Company Nanosurf AG / HZS-Nanosurf Co. Ltd. / Nanosurf Inc. / Nanosurf GmbH / / Country Switzerland / United States of America / / / IndustryTerm mm travel / hard-coated metal surface / alignment chip technology / / NaturalFeature Step heights / / / Position controller / Quality Assurance LensAFM Scan Head / / ProvinceOrState Massachusetts / / Technology alignment chip technology / / URL www.hzs- / www.nanosurf.com / www.nanosurf.de / / SocialTag Scanning probe microscopy Lenses Intermolecular forces Laboratory techniques Microscopy Atomic force microscopy Optical microscope Profilometer Objective Scientific method

Nanosurf LensAFM Enhance Your Optical Microscope or Profilometer Atomic Force Microscope capabilities: • Visualize your samples with nanometer resolution • Obtain 3-dimensional surface structure dataAdd to Reading List