3D Measurements in the Scanning E l e c t ron Micro s c o p e MeX turns your SEM into a fully functional 3D measurement device. It visualizes the topography of the observed object and 3D analysis directly in the digital

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Date: 2011-06-13 19:16:14 Microscopy Science Chemistry Metrology Technology ISO 25178 Materials science Waviness Profilometer		3D Measurements in the Scanning E l e c t ron Micro s c o p e MeX turns your SEM into a fully functional 3D measurement device. It visualizes the topography of the observed object and 3D analysis directly in the digital Add to Reading List Source URL: old.cpx-solutions.com Download Document from Source Website File Size: 1,17 MB Share Document on Facebook

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