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Electromagnetism / IEEE Electron Devices Society / International Electron Devices Meeting / Institute of Electrical and Electronics Engineers / Integrated circuit / Laser diode / Reliability engineering / Hot carrier injection / Symposium on VLSI Circuits / Semiconductors / Electronic engineering / Engineering
Date: 2012-02-07 15:25:18
Electromagnetism
IEEE Electron Devices Society
International Electron Devices Meeting
Institute of Electrical and Electronics Engineers
Integrated circuit
Laser diode
Reliability engineering
Hot carrier injection
Symposium on VLSI Circuits
Semiconductors
Electronic engineering
Engineering

E LECTRON DEVICES S OCIETY IEEE ELECTRON DEVICES SOCIETY OctVol. 10, No. 4

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