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	SISPAD 2012, September 5-7, 2012, Denver, CO, USA Development of Predictive Model and Circuit Simulation Methodology for Negative Bias Temperature Instability Effects C. Ma, H. J. Mattausch, M. Miyake, Add to Reading List Document Date: 2013-02-12 08:39:15 Open Document File Size: 265,39 KB Share Result on Facebook

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SISPAD 2012, September 5-7, 2012, Denver, CO, USA Development of Predictive Model and Circuit Simulation Methodology for Negative Bias Temperature Instability Effects C. Ma, H. J. Mattausch, M. Miyake,Add to Reading List