![](https://www.pdfsearch.io/img/091f91f353c323b6ae219d6ec8995e05.jpg) Date: 2017-11-01 22:26:41
| | OCVD 法によるダイヤモンド p-i-n ダイオードのキャリア寿命測定 Carrier lifetime in diamond p-i-n diode by Open Circuit Voltage Decay method (OCVD) ○ A. Traore1, A. Nakajima1, T. Makino1, D. KuwabaAdd to Reading ListSource URL: bukko.bk.tsukuba.ac.jpDownload Document from Source Website File Size: 145,49 KBShare Document on Facebook
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