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Exploiting Coarse-Grain Verification Parallelism for Power-Efficient Fault Tolerance M. Wasiur Rashid, Edwin J. Tan, and Michael C. Huang Department of Electrical & Computer Engineering University of Rochester {rashid, e
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Document Date: 2005-08-24 14:59:38
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Exploiting Coarse-Grain Verification Parallelism for Power-Efficient Fault Tolerance M. Wasiur Rashid, Edwin J. Tan, and Michael C. Huang Department of Electrical & Computer Engineering University of Rochester {rashid, e