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Electromagnetic radiation / Measurement / Polarization / Crystallography / Optical devices / Birefringence / Refractive index / Index ellipsoid / Refractometer / Optics / Physics / Optical mineralogy


Document Date: 2007-08-26 09:08:37

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City

Washington / New York / Cambridge / /

Company

OX OY / John Wiley and Sons / /

Country

United States / /

Currency

pence / USD / /

Facility

Harvard University / /

IndustryTerm

thin section using dispersion stainingand oil immersion / oil / /

Organization

Harvard University / Department of Geological Sciences / Harvard / /

Person

Richard T. Liddicoat / Jr. / David Walker / Ray E. Wilcox / Robert F. Dymek / Bowen Volume / Carl A. Francis / F. Herbert Smith / S REFRACTOMETER / F. Donald Bloss / /

Position

Abstract The jeweler / jeweler / Mineralogist / gemologist / /

ProvinceOrState

California / New York / Massachusetts / /

PublishedMedium

American Journal of Science / /

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