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![]() Date: 2009-11-09 02:38:50Colloidal chemistry Chemical engineering Laser diffraction analysis Spectroscopy Diffraction Particle-size distribution Particle size Particle-size analysis Optics Physics Chemistry Science | Add to Reading List |
![]() | X-RAY DIFFRACTION RESIDUAL STRESS MEASUREMENT AND SHOT PEENING QUANTITATIVE CHARACTERIZATION OF PEENING PROCESSES USING X-RAY DIFFRACTION RESIDUAL STRESS ANALYSIS The residual stresses present in manufactured components,DocID: 1qHz7 - View Document |
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