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Date: 2012-12-06 15:23:05Knowledge Film editing Wipe Sampling risk Drug test Force-Sensing Resistor Statistics Science Sampling | Presented at : Forensics@NIST 2012, Gaithersburg, MD, November 29, 2012 Jennifer Verkouteren, Jessica Grandner, Kirsten MacIsaac, Nicholas Ritchie National Institute of Standards and Technology, Gaithersburg, MD[removed]UAdd to Reading ListSource URL: www.nist.govDownload Document from Source WebsiteFile Size: 1,51 MBShare Document on Facebook |