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An Empirical Study of the Fault-Proneness of Clone Mutation and Clone Migration Shuai Xie1 , Foutse Khomh2 , Ying Zou1 1 Department of Electrical and Computer Engineering, Queen’s University, Canada.
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Document Date: 2013-03-29 15:11:31
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File Size: 1,54 MB
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An Empirical Study of the Fault-Proneness of Clone Mutation and Clone Migration Shuai Xie1 , Foutse Khomh2 , Ying Zou1 1 Department of Electrical and Computer Engineering, Queen’s University, Canada.