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Chemistry / Focused ion beam / Electron microscope / Transmission electron microscopy / Scanning electron microscope / X-ray photoelectron spectroscopy / Characterization / Atomic force microscopy / Raman spectroscopy / Scientific method / Science / Electron microscopy
Date: 2006-01-31 06:16:22
Chemistry
Focused ion beam
Electron microscope
Transmission electron microscopy
Scanning electron microscope
X-ray photoelectron spectroscopy
Characterization
Atomic force microscopy
Raman spectroscopy
Scientific method
Science
Electron microscopy

Automated Image Analysis Methods for Characterization and Measurement of Nanomaterials Center for Biological and Environmental Nanotechnology Rice University

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