Newly Developed Soft X-ray High Energy Resolution Grating Spectrometer Opens Up the Door of Routine Analysis of Li by Electron Microscopes November 25, 2013 Japan Science and Technology Agency (JST) JEOL Ltd. Tohoku Univ

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Date: 2014-02-14 00:20:00 Spectroscopy X-ray spectroscopy Electron microprobe Electron Scanning electron microscope Monochromator X-ray Emission spectrum Particle-induced X-ray emission Physics Science Scientific method		Newly Developed Soft X-ray High Energy Resolution Grating Spectrometer Opens Up the Door of Routine Analysis of Li by Electron Microscopes November 25, 2013 Japan Science and Technology Agency (JST) JEOL Ltd. Tohoku Univ Add to Reading List Source URL: www.jeol.co.jp Download Document from Source Website File Size: 938,75 KB Share Document on Facebook

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