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Scanning electron microscope / Electron microscope / Microscopy / Environmental scanning electron microscope / Scientific method / Science / Electron microscopy


Low kV Multispectral Imaging in FEG-SEM
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Document Date: 2013-07-31 11:43:53

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File Size: 1,01 MB

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City

Cambridge / Peabody / New York / JSM / /

Company

V. Robertson JEOL USA Inc. / /

Facility

Scale bar / Harvard University / /

IndustryTerm

high resolution imaging / ultra low kV imaging / unsurpassed imaging performance / ultrahigh resolution imaging / backscatter imaging data / low beam current applications / imaging / nanomaterials applications / low energy electron sensitivity / /

Organization

Harvard University / MIT / /

Person

D.C. Bell / J. Kong / A. Reina / /

Position

using JEOL Cross Section polisher / representative / /

ProvinceOrState

New York / Massachusetts / /

Technology

alpha / X-ray / SEM technology / JEOL technology / ACL technology / /

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